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Degradation of Junction Parameters of an Electrically Stressed NPN Bipolar Transistor
Junction Parameters an Electrically Stressed NPN Bipolar Transistor
2010/12/8
The effect of an electrical ageing on npn bipolar transistor has been studied. The current gain decreases substantially and the electrical properties are discussed. The emitter-base junction parameter...
Degradation of VDMOSFET by Heavy Ion Irradiations
Hot-holes transistor degradation fast surface states ionization radiation
2010/12/8
This article focuses on the effect of the heavy ions irradiations on the electrical characteristics of VDMOSFET (Vertical Diffusion Metal Oxide Semiconductor Field Effect Transistor) devices. A summar...