搜索结果: 1-12 共查到“电子技术其他学科 Temperature”相关记录12条 . 查询时间(0.109 秒)
Ultra-Low Temperature Coefficient of Capacitance (Tcc) of the SrSnO3-Based Electrical Components
Strontium metastannate Capacitor component Electroceramics Dielectrics Complex plane analysis
2010/12/7
The perovskite-structured SrSnO3 possessing steady capacitance over the temperature range between 27°C and 300°C in a frequency domain spanning nearly four decades has been evaluated. The samples inve...
Experimental Studies of New GaAs Metal/Insulator/p-n+ Switches Using Low Temperature Oxide
Negative differential resistance (NDR) Liquid phase chemical-enhanced oxide (LPECO)
2010/12/7
First observation of switching behavior is reported in GaAs metal-insulator-p-n+ structure, where the thin insulator is grown at low temperature by a liquid phase chemical-enhanced oxide (LPECO) with ...
Fabrication and Characterization of Multilayer Capacitors Buried in a Low Temperature Co-Fired Ceramic Substrate
Capacitor embedded low temperature co-fired ceramic
2010/12/10
Multilayer ceramic capacitors designed to be embedded in a low temperature co-fired ceramic substrate have been successfully fabricated. Low and high value capacitors were respectively embedded in the...
The a-SiC/c-Si(n) Isotype Heterojunction as a High Sensitivity Temperature Sensor
Heterojunction temperature sensors microelectronic devices
2010/12/10
The a-SiC/c-Si(n) isotype heterojunction has been studied as a temperature sensor by measuring its reverse current-voltage (IR−V) and reverse voltage-temperature (V-T) characteristics, as well a...
A Brief Study on Energy in Itinerant-Electron Metamagnetic Materials at Very Low Temperature
Energy Itinerant-Electron Metamagnetic Materials Low Temperature
2010/12/10
Electronic energy is calculated explicitly for itinerant-electron metamagnetic materials at very low temperature. This calculation involves bandwidth and consequently volume, and it has been performed...
Physical Properties of Sputtered Germanium-Doped Indium Tin Oxide Films (ITO: Ge) Obtained at Low Deposition Temperature
Sputtered Germanium-Doped Indium Tin Oxide Films Low Deposition Temperature
2010/12/16
Undoped and Ge-doped ITO films (ITO: Ge) deposited at low temperature (70℃) have been studied. Although both samples have the same carrier concentration, a higher carrier mobility occurs for ITO: Ge. ...
The Effect of Various Factors on the Resistance and TCR of RuO2 Thick Film Resistors—Relation Between the Electrical Properties and Particle Size of Constituents, the Physical Properties of Glass and Firing Temperature
RuO2 Thick Film Resistors Constituents Glass and Firing Temperature
2010/12/21
Thick film resistors were prepared with different variables, they included various conductive particle sizes, glass particle sizes, glass softening temperatures, thermal expansion coefficients of the ...
Low Temperature Firing of Pb-Contained Thick Film Dielectrics
Low Temperature Pb-Contained Thick Film Dielectrics
2010/12/21
The preparation and properties of the Pb(Fe2/3W1/3)x(Fe1/2Nb1/2)0.86–xTi0.14O3-based thick film dielectrics are described. The Calcined Pb(Fe2/3W1/3)O3 powder, instead of glass frit, is used as the fl...
Microstructural Studies of Ni-P Thick Film Resistor Temperature Sensors
Thick Ni-P films various microscopic methods electrical conduction
2010/12/21
Thick Ni-P films have been widely investigated at our Institute. This article tends to visualize by use of various microscopic methods how the growth and sintering of individual conducting grains, res...
Thick Film Resistors on Dielectrics as Temperature Detectors
Thick Film Resistors Dielectrics Temperature Detectors
2010/12/21
Thick film resistors made of typical ruthenate pastes on various dielectrics change their properties. The properties of such resistors, fabricated on the TiO2 + glass dielectric, have been evaluated i...
The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components
the Non-Contacting Temperature Measuring Techniques Hidden Faults Electronic Components
2010/12/23
One of the reasons for a reduction of production quality is the so-called ‘hidden faults’, i.e. defects which will not be detected by the available testing equipment in spite of measures for ensuring ...
New Thick-Film Temperature Sensors Applied in Some Hybrid Measurement Devices
New Thick-Film Temperature Sensors Hybrid Measurement Devices
2010/12/27
The present paper is devoted to the technological problems connected with the construction, the choice of pastes and substrates, the screening process and the laser or abrasive trimming involved in th...