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For 54 years, IRPS has been the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United Stat...
As few or no failures occur during accelerated life test, it is difficult to assess reliability for long-life products with traditional life tests. Reliability assessment using degradation data of pro...
Steel structure system of crane deteriorates over time due to environmental effects, material fatigue, and overloading. System structural reliability and remaining service life assessment methods are ...

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