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Prospects of 4H-SiC Double Drift Region IMPATT Device as a Photo-Sensitive High-Power Source at 0.7 Terahertz Frequency Regime
4H-SiC Double Drift Region IMPATT Device a Photo-Sensitive High-Power Source 0.7 Terahertz Frequency Regime
2010/12/6
The dynamic performance of wide-bandgap 4H-SiC based double drift region (p++ p n n++) IMPATT diode is simulated for the first time at terahertz frequency (0.7 Terahertz) region. The simulation experi...
GaN based FET devices represent at present the solid state power sources of highest microwave output power. Their materials structure and technology is briefly reviewed and their mitations and problem...